A Comprehensive Survey on Test-Time Adaptation under Distribution Shifts

Abstract--Machine learning methods strive to acquire a robust model during training that can generalize well to test samples, even under distribution shifts. However, these methods often suffer from a performance drop due to unknown test distributions. Test-time adaptation (TTA), an emerging paradigm, has the potential to adapt a pre-trained model to unlabeled data during testing, before making predictions. Recent progress in this paradigm highlights the significant benefits of utilizing unlabeled data for training self-adapted models prior to inference. In this survey, we divide TTA into several distinct categories, namely, test-time (source-free) domain adaptation, test-time batch adaptation, online test-time adaptation, and test-time prior adaptation. For each category, we provide a comprehensive taxonomy of advanced algorithms, followed by a discussion of different learning scenarios. Furthermore, we analyze relevant applications of TTA and discuss open challenges and promising areas for future research. However, when the test distribution (target) differs from the training distribution (source), we face the problem of distribution shifts. Such a shift poses significant challenges for machine learning systems deployed in the wild, such as images captured by different cameras [2], road scenes of different cities [3], and imaging devices in different hospitals [4]. In contrast, TTA only requires access to the pre-trained from one or multiple source domains that can generalize model from the source domain, making it a secure and well to any out-of-distribution target domain. Figure 1: test-time domain adaptation, test-time batch adaptation This survey primarily focuses on test-time adaptation (TTBA), and online test-time adaptation (OTTA). That is to say, test data. Additionally, DA typically necessitates access to the predictions of each mini-batch are independent of the both labeled data from the source domain and (unlabeled) predictions for the other mini-batches. Ran He is also with the School of Artificial Intelligence, University of Chinese Academy of Sciences. In this survey, we use the terms "test data" and "target data" Tieniu Tan is also with Nanjing University, China. DA methods rely on the existence of source applied to OTTA with the assumption of knowledge reuse.