Learning From Weakly Supervised Data by The Expectation Loss SVM (e-SVM) algorithm
Jun Zhu, Junhua Mao, Alan L. Yuille
–Neural Information Processing Systems
In many situations we have some measurement of confidence on "positiveness" for a binary label. The "positiveness" is a continuous value whose range is a bounded interval.
Neural Information Processing Systems
Feb-9-2025, 00:29:40 GMT
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