Xu, Yuanfan
Localization matters too: How localization error affects UAV flight
Zhang, Suquan, Xu, Yuanfan, Yu, Shu'ang, Liao, Qingmin, Yu, Jincheng, Wang, Yu
The maximum safe flight speed of a Unmanned Aerial Vehicle (UAV) is an important indicator for measuring its efficiency in completing various tasks. This indicator is influenced by numerous parameters such as UAV localization error, perception range, and system latency. However, in terms of localization errors, although there have been many studies dedicated to improving the localization capability of UAVs, there is a lack of quantitative research on their impact on speed. In this work, we model the relationship between various parameters of the UAV and its maximum flight speed. We consider a scenario similar to navigating through dense forests, where the UAV needs to quickly avoid obstacles directly ahead and swiftly reorient after avoidance. Based on this scenario, we studied how parameters such as localization error affect the maximum safe speed during UAV flight, as well as the coupling relationships between these parameters. Furthermore, we validated our model in a simulation environment, and the results showed that the predicted maximum safe speed had an error of less than 20% compared to the test speed. In high-density situations, localization error has a significant impact on the UAV's maximum safe flight speed. This model can help designers utilize more suitable software and hardware to construct a UAV system.
Variational Automatic Curriculum Learning for Sparse-Reward Cooperative Multi-Agent Problems
Chen, Jiayu, Zhang, Yuanxin, Xu, Yuanfan, Ma, Huimin, Yang, Huazhong, Song, Jiaming, Wang, Yu, Wu, Yi
We introduce a curriculum learning algorithm, Variational Automatic Curriculum Learning (VACL), for solving challenging goal-conditioned cooperative multi-agent reinforcement learning problems. We motivate our paradigm through a variational perspective, where the learning objective can be decomposed into two terms: task learning on the current task distribution, and curriculum update to a new task distribution. Local optimization over the second term suggests that the curriculum should gradually expand the training tasks from easy to hard. Our VACL algorithm implements this variational paradigm with two practical components, task expansion and entity progression, which produces training curricula over both the task configurations as well as the number of entities in the task. Experiment results show that VACL solves a collection of sparse-reward problems with a large number of agents. Particularly, using a single desktop machine, VACL achieves 98% coverage rate with 100 agents in the simple-spread benchmark and reproduces the ramp-use behavior originally shown in OpenAI's hide-and-seek project. Our project website is at https://sites.google.com/view/vacl-neurips-2021.
Machine Learning for Electronic Design Automation: A Survey
Huang, Guyue, Hu, Jingbo, He, Yifan, Liu, Jialong, Ma, Mingyuan, Shen, Zhaoyang, Wu, Juejian, Xu, Yuanfan, Zhang, Hengrui, Zhong, Kai, Ning, Xuefei, Ma, Yuzhe, Yang, Haoyu, Yu, Bei, Yang, Huazhong, Wang, Yu
In recent years, with the development of semiconductor technology, the scale of integrated circuit (IC) has grown exponentially, challenging the scalability and reliability of the circuit design flow. Therefore, EDA algorithms and software are required to be more effective and efficient to deal with extremely large search space with low latency. Machine learning (ML) is taking an important role in our lives these days, which has been widely used in many scenarios. ML methods, including traditional and deep learning algorithms, achieve amazing performance in solving classification, detection, and design space exploration problems. Additionally, ML methods show great potential to generate high-quality solutions for many NP-complete (NPC) problems, which are common in the EDA field, while traditional methods lead to huge time and resource consumption to solve these problems. Traditional methods usually solve every problem from the beginning, with a lack of knowledge accumulation. Instead, ML algorithms focus on extracting high-level features or patterns that can be reused in other related or similar situations, avoiding repeated complicated analysis. Therefore, applying machine learning methods is a promising direction to accelerate the solving of EDA problems. These authors are ordered alphabetically.