Learning from ambiguous training data is highly relevant in many applications. We present a new learning algorithm for classification problems where labels are associated with sets of pattern instead of individual patterns. This encompasses multiple instance learning as a special case. Our approach is based on a generalization of linear programming boosting and uses results from disjunctive programming to generate successively stronger linear relaxations of a discrete non-convex problem.

A special case of particular relevance is known as multiple instance learning [5]

This paper presents two new formulations of multiple-instance learning as a maximum margin problem. The proposed extensions of the Support Vector Machine (SVM) learning approach lead to mixed integer quadratic programs that can be solved heuristically. Our generalization of SVMs makes a state-of-the-art classification technique, including nonlinear classification via kernels, available to an area that up to now has been largely dominated by special purpose methods. We present experimental results on a pharmaceutical data set and on applications in automated image indexing and document categorization.

This paper presents two new formulations of multiple-instance learning as a maximum margin problem. The proposed extensions of the Support Vector Machine (SVM) learning approach lead to mixed integer quadratic programs that can be solved heuristically. Our generalization of SVMs makes a state-of-the-art classification technique, including nonlinear classification via kernels, available to an area that up to now has been largely dominated by special purpose methods. We present experimental results on a pharmaceutical dataset and on applications in automated image indexing and document categorization. 1 Introduction Multiple-instance learning (MIL) [4] is a generalization of supervised classification in which training class labels are associated with sets of patterns, or bags, instead of individual patterns. While every pattern may possess an associated true label, it is assumed that pattern labels are only indirectly accessible through labels attached to bags.