Di erentially Private Testing of Identity and Closeness of Discrete Distributions

Neural Information Processing Systems 

We study the fundamental problems of identity testing (goodness of fit), and closeness testing (two sample test) of distributions over k elements, under di erential privacy. While the problems have a long history in statistics, finite sample bounds for these problems have only been established recently. In this work, we derive upper and lower bounds on the sample complexity of both the problems under (Á, ")-di erential privacy. We provide sample optimal algorithms for identity testing problem for all parameter ranges, and the first results for closeness testing. Our closeness testing bounds are optimal in the sparse regime where the number of samples is at most k.

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