Learning to Learn By Self-Critique

Antreas Antoniou, Amos J. Storkey

Neural Information Processing Systems 

In few-shot learning, a machine learning system learns from a small set of labelled examples relating to a specific task, such that it can generalize to new examples of the same task. Given the limited availability of labelled examples in such tasks, we wish to make use of all the information we can. Usually a model learns task-specific information from a small training-set ( support-set) to predict on an unlabelled validation set ( target-set). The target-set contains additional task-specific information which is not utilized by existing few-shot learning methods. Making use of the target-set examples via transductive learning requires approaches beyond the current methods; at inference time, the target-set contains only unlabelled input data-points, and so discriminative learning cannot be used. In this paper, we propose a framework called Self-Critique and Adapt or SCA, which learns to learn an label-free loss function, parameterized as a neural network. A base-model learns on a support-set using existing methods (e.g.

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