These works are regarded as passive works for object detection as they take the input image as is. However, convergence to global minima is not guaranteed to be optimal in neural networks; therefore, we argue that the trained weights in the object detector are not optimal. To rectify this problem, we propose a wrapper based on proactive schemes, PrObeD, which enhances the performance of these object detectors by learning a signal. PrObeD consists of an encoder-decoder architecture, where the encoder network generates an image-dependent signal termed templates to encrypt the input images, and the decoder recovers this template from the encrypted images. We propose that learning the optimum template results in an object detector with an improved detection performance. The template acts as a mask to the input images to highlight semantics useful for the object detector. Finetuning the object detector with these encrypted images enhances the detection performance for both generic and camouflaged.

As aresult, there is aproliferation of distinct architectures and loss functions for different vision tasks.

Existing object detection frameworks are usually built on a single format of object/part representation, i.e., anchor/proposal rectangle boxes in RetinaNet and Faster R-CNN, center points in FCOS and RepPoints, and corner points in CornerNet. While these different representations usually drive the frameworks to perform well in different aspects, e.g., better classification or finer localization, it is in general difficult to combine these representations in a single framework to make good use of each strength, due to the heterogeneous or non-grid feature extraction by different representations.

The efficacy of Artificial Intelligence (AI) in micro/nano manufacturing is fundamentally constrained by the scarcity of high-quality and physically grounded training data for defect inspection. Lithography defect data from semiconductor industry are rarely accessible for research use, resulting in a shortage of publicly available datasets. To address this bottleneck in lithography, this study proposes a novel methodology for generating large-scale, physically valid defect datasets with pixel-level annotations. The framework begins with the ab initio synthesis of defect layouts using controllable, physics-constrained mathematical morphology operations (erosion and dilation) applied to the original design-level layout. These synthesized layouts, together with their defect-free counterparts, are fabricated into physical samples via high-fidelity digital micromirror device (DMD)-based lithography. Optical micrographs of the synthesized defect samples and their defect-free references are then compared to create consistent defect delineation annotations. Using this methodology, we constructed a comprehensive dataset of 3,530 Optical micrographs containing 13,365 annotated defect instances including four classes: bridge, burr, pinch, and contamination. Each defect instance is annotated with a pixel-accurate segmentation mask, preserving full contour and geometry. The segmentation-based Mask R-CNN achieves AP@0.5 of 0.980, 0.965, and 0.971, compared with 0.740, 0.719, and 0.717 for Faster R-CNN on bridge, burr, and pinch classes, representing a mean AP@0.5 improvement of approximately 34%. For the contamination class, Mask R-CNN achieves an AP@0.5 roughly 42% higher than Faster R-CNN. These consistent gains demonstrate that our proposed methodology to generate defect datasets with pixel-level annotations is feasible for robust AI-based Measurement/Inspection (MI) in semiconductor fabrication.

VOC datasets (e.g., 83.6% mAP on the 2007 set) with the 101-layer ResNet. Meanwhile, our result is achieved at a test-time speed of 170ms per image, 2.5-20

The increasing adoption of satellite Internet with low-Earth-orbit (LEO) satellites in mega-constellations allows ubiquitous connectivity to rural and remote areas. However, weather events have a significant impact on the performance and reliability of satellite Internet. Adverse weather events such as snow and rain can disturb the performance and operations of satellite Internet's essential ground terminal components, such as satellite antennas, significantly disrupting the space-ground link conditions between LEO satellites and ground stations. This challenge calls for not only region-based weather forecasts but also fine-grained detection capability on ground terminal components of fine-grained weather conditions. Such a capability can assist in fault diagnostics and mitigation for reliable satellite Internet, but its solutions are lacking, not to mention the effectiveness and generalization that are essential in real-world deployments. This paper discusses an efficient transfer learning (TL) method that can enable a ground component to locally detect representative weather-related conditions. The proposed method can detect snow, wet, and other conditions resulting from adverse and typical weather events and shows superior performance compared to the typical deep learning methods, such as YOLOv7, YOLOv9, Faster R-CNN, and R-YOLO. Our TL method also shows the advantage of being generalizable to various scenarios.