Neural Information Processing Systems http://nips.cc/

Collecting labeled data is costly and thus a critical bottleneck in real-world classification tasks. To mitigate this problem, we propose a novel setting, namely learning from complementary labels for multi-class classification. A complementary label specifies a class that a pattern does not belong to. Collecting complementary labels would be less laborious than collecting ordinary labels, since users do not have to carefully choose the correct class from a long list of candidate classes. However, complementary labels are less informative than ordinary labels and thus a suitable approach is needed to better learn from them. In this paper, we show that an unbiased estimator to the classification risk can be obtained only from complementarily labeled data, if a loss function satisfies a particular symmetric condition. We derive estimation error bounds for the proposed method and prove that the optimal parametric convergence rate is achieved. We further show that learning from complementary labels can be easily combined with learning from ordinary labels (i.e., ordinary supervised learning), providing a highly practical implementation of the proposed method. Finally, we experimentally demonstrate the usefulness of the proposed methods.

A weakly-supervised learning framework named as complementary-label learning has been proposed recently, where each sample is equipped with a single complementary label that denotes one of the classes the sample does not belong to. However, the existing complementary-label learning methods cannot learn from the easily accessible unlabeled samples and samples with multiple complementary labels, which are more informative. In this paper, to remove these limitations, we propose the novel multi-complementary and unlabeled learning framework that allows unbiased estimation of classification risk from samples with any number of complementary labels and unlabeled samples, for arbitrary loss functions and models. We first give an unbiased estimator of the classification risk from samples with multiple complementary labels, and then further improve the estimator by incorporating unlabeled samples into the risk formulation. The estimation error bounds show that the proposed methods are in the optimal parametric convergence rate. Finally, the experiments on both linear and deep models show the effectiveness of our methods.

In contrast to the standard classification paradigm where the true (or possibly noisy) class is given to each training pattern, complementary-label learning only uses training patterns each equipped with a complementary label. This only specifies one of the classes that the pattern does not belong to. The seminal paper on complementary-label learning proposed an unbiased estimator of the classification risk that can be computed only from complementarily labeled data. However, it required a restrictive condition on the loss functions, making it impossible to use popular losses such as the softmax cross-entropy loss. Recently, another formulation with the softmax cross-entropy loss was proposed with consistency guarantee. However, this formulation does not explicitly involve a risk estimator. Thus model/hyper-parameter selection is not possible by cross-validation---we may need additional ordinarily labeled data for validation purposes, which is not available in the current setup. In this paper, we give a novel general framework of complementary-label learning, and derive an unbiased risk estimator for arbitrary losses and models. We further improve the risk estimator by non-negative correction and demonstrate its superiority through experiments.

Collecting labeled data is costly and thus a critical bottleneck in real-world classification tasks. To mitigate this problem, we propose a novel setting, namely learning from complementary labels for multi-class classification. A complementary label specifies a class that a pattern does not belong to. Collecting complementary labels would be less laborious than collecting ordinary labels, since users do not have to carefully choose the correct class from a long list of candidate classes. However, complementary labels are less informative than ordinary labels and thus a suitable approach is needed to better learn from them. In this paper, we show that an unbiased estimator to the classification risk can be obtained only from complementarily labeled data, if a loss function satisfies a particular symmetric condition. We derive estimation error bounds for the proposed method and prove that the optimal parametric convergence rate is achieved. We further show that learning from complementary labels can be easily combined with learning from ordinary labels (i.e., ordinary supervised learning), providing a highly practical implementation of the proposed method. Finally, we experimentally demonstrate the usefulness of the proposed methods.

Collecting labeled data is costly and thus a critical bottleneck in real-world classification tasks. To mitigate this problem, we propose a novel setting, namely learning from complementary labels for multi-class classification. A complementary label specifies a class that a pattern does not belong to. Collecting complementary labels would be less laborious than collecting ordinary labels, since users do not have to carefully choose the correct class from a long list of candidate classes. However, complementary labels are less informative than ordinary labels and thus a suitable approach is needed to better learn from them. In this paper, we show that an unbiased estimator to the classification risk can be obtained only from complementarily labeled data, if a loss function satisfies a particular symmetric condition. We derive estimation error bounds for the proposed method and prove that the optimal parametric convergence rate is achieved. We further show that learning from complementary labels can be easily combined with learning from ordinary labels (i.e., ordinary supervised learning), providing a highly practical implementation of the proposed method. Finally, we experimentally demonstrate the usefulness of the proposed methods.