In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

Intelligence is key to advancing integrated circuit (IC) fabrication. Recent breakthroughs in Large Multimodal Models (LMMs) have unlocked unparalleled abilities in understanding images and text, fostering intelligent fabrication. Leveraging the power of LMMs, we introduce FabGPT, a customized IC fabrication large multimodal model for wafer defect knowledge query. FabGPT manifests expertise in conducting defect detection in Scanning Electron Microscope (SEM) images, performing root cause analysis, and providing expert question-answering (Q&A) on fabrication processes. FabGPT matches enhanced multimodal features to automatically detect minute defects under complex wafer backgrounds and reduce the subjectivity of manual threshold settings. Besides, the proposed modulation module and interactive corpus training strategy embed wafer defect knowledge into the pre-trained model, effectively balancing Q&A queries related to defect knowledge and original knowledge and mitigating the modality bias issues. Experiments on in-house fab data (SEM-WaD) show that our FabGPT achieves significant performance improvement in wafer defect detection and knowledge querying.

Deep neural networks (DNNs) have made breakthroughs in various fields including image recognition and language processing. DNNs execute hundreds of millions of multiply-and-accumulate (MAC) operations. To efficiently accelerate such computations, analog in-memory-computing platforms have emerged leveraging emerging devices such as resistive RAM (RRAM). However, such accelerators face the hurdle of being required to have sufficient on-chip crossbars to hold all the weights of a DNN. Otherwise, RRAM cells in the crossbars need to be reprogramed to process further layers, which causes huge time/energy overhead due to the extremely slow writing and verification of the RRAM cells. As a result, it is still not possible to deploy such accelerators to process large-scale DNNs in industry. To address this problem, we propose the BasisN framework to accelerate DNNs on any number of available crossbars without reprogramming. BasisN introduces a novel representation of the kernels in DNN layers as combinations of global basis vectors shared between all layers with quantized coefficients. These basis vectors are written to crossbars only once and used for the computations of all layers with marginal hardware modification. BasisN also provides a novel training approach to enhance computation parallelization with the global basis vectors and optimize the coefficients to construct the kernels. Experimental results demonstrate that cycles per inference and energy-delay product were reduced to below 1% compared with applying reprogramming on crossbars in processing large-scale DNNs such as DenseNet and ResNet on ImageNet and CIFAR100 datasets, while the training and hardware costs are negligible.

In this paper, we introduce a novel low-latency inference framework for large language models (LLMs) inference which enables LLMs to perform inferences with incomplete prompts. By reallocating computational processes to prompt input phase, we achieve a substantial reduction in latency, thereby significantly enhancing the interactive experience for users of LLMs. The framework adeptly manages the visibility of the streaming prompt to the model, allowing it to infer from incomplete prompts or await additional prompts. Compared with traditional inference methods that utilize complete prompts, our approach demonstrates an average reduction of 59% in response latency on the MMLU-Pro dataset, while maintaining comparable accuracy. Additionally, our framework facilitates collaborative inference and output across different models. By employing an LLM for inference and a small language model (SLM) for output, we achieve an average 68% reduction in response latency, alongside a 5.5% improvement in accuracy on the MMLU-Pro dataset compared with the SLM baseline. For long prompts exceeding 20 sentences, the response latency can be reduced by up to 93%.

Deep neural networks (DNNs) have demonstrated remarkable success in various fields. However, the large number of floating-point operations (FLOPs) in DNNs poses challenges for their deployment in resource-constrained applications, e.g., edge devices. To address the problem, pruning has been introduced to reduce the computational cost in executing DNNs. Previous pruning strategies are based on weight values, gradient values and activation outputs. Different from previous pruning solutions, in this paper, we propose a class-aware pruning technique to compress DNNs, which provides a novel perspective to reduce the computational cost of DNNs. In each iteration, the neural network training is modified to facilitate the class-aware pruning. Afterwards, the importance of filters with respect to the number of classes is evaluated. The filters that are only important for a few number of classes are removed. The neural network is then retrained to compensate for the incurred accuracy loss. The pruning iterations end until no filter can be removed anymore, indicating that the remaining filters are very important for many classes. This pruning technique outperforms previous pruning solutions in terms of accuracy, pruning ratio and the reduction of FLOPs. Experimental results confirm that this class-aware pruning technique can significantly reduce the number of weights and FLOPs, while maintaining a high inference accuracy.

Deep neural networks (DNNs) have been widely deployed across diverse domains such as computer vision and natural language processing. However, the impressive accomplishments of DNNs have been realized alongside extensive computational demands, thereby impeding their applicability on resource-constrained devices. To address this challenge, many researchers have been focusing on basic neuron structures, the fundamental building blocks of neural networks, to alleviate the computational and storage cost. In this work, an efficient quadratic neuron architecture distinguished by its enhanced utilization of second-order computational information is introduced. By virtue of their better expressivity, DNNs employing the proposed quadratic neurons can attain similar accuracy with fewer neurons and computational cost. Experimental results have demonstrated that the proposed quadratic neuron structure exhibits superior computational and storage efficiency across various tasks when compared with both linear and non-linear neurons in prior work.

Deep neural networks (DNN) have been designed to predict the chronological age of a healthy brain from T1-weighted magnetic resonance images (T1 MRIs), and the predicted brain age could serve as a valuable biomarker for the early detection of development-related or aging-related disorders. Recent DNN models for brain age estimations usually rely too much on large sample sizes and complex network structures for multi-stage feature refinement. However, in clinical application scenarios, researchers usually cannot obtain thousands or tens of thousands of MRIs in each data center for thorough training of these complex models. This paper proposes a simple fully convolutional network (SFCNeXt) for brain age estimation in small-sized cohorts with biased age distributions. The SFCNeXt consists of Single Pathway Encoded ConvNeXt (SPEC) and Hybrid Ranking Loss (HRL), aiming to estimate brain ages in a lightweight way with a sufficient exploration of MRI, age, and ranking features of each batch of subjects. Experimental results demonstrate the superiority and efficiency of our approach.

Deep neural networks (DNNs) have successfully been applied in many fields in the past decades. However, the increasing number of multiply-and-accumulate (MAC) operations in DNNs prevents their application in resource-constrained and resource-varying platforms, e.g., mobile phones and autonomous vehicles. In such platforms, neural networks need to provide acceptable results quickly and the accuracy of the results should be able to be enhanced dynamically according to the computational resources available in the computing system. To address these challenges, we propose a design framework called SteppingNet. SteppingNet constructs a series of subnets whose accuracy is incrementally enhanced as more MAC operations become available. Therefore, this design allows a trade-off between accuracy and latency. In addition, the larger subnets in SteppingNet are built upon smaller subnets, so that the results of the latter can directly be reused in the former without recomputation. This property allows SteppingNet to decide on-the-fly whether to enhance the inference accuracy by executing further MAC operations. Experimental results demonstrate that SteppingNet provides an effective incremental accuracy improvement and its inference accuracy consistently outperforms the state-of-the-art work under the same limit of computational resources.

With the popularity of deep learning, the hardware implementation platform of deep learning has received increasing interest. Unlike the general purpose devices, e.g., CPU, or GPU, where the deep learning algorithms are executed at the software level, neural network hardware accelerators directly execute the algorithms to achieve higher both energy efficiency and performance improvements. However, as the deep learning algorithms evolve frequently, the engineering effort and cost of designing the hardware accelerators are greatly increased. To improve the design quality while saving the cost, design automation for neural network accelerators was proposed, where design space exploration algorithms are used to automatically search the optimized accelerator design within a design space. Nevertheless, the increasing complexity of the neural network accelerators brings the increasing dimensions to the design space. As a result, the previous design space exploration algorithms are no longer effective enough to find an optimized design. In this work, we propose a neural network accelerator design automation framework named GANDSE, where we rethink the problem of design space exploration, and propose a novel approach based on the generative adversarial network (GAN) to support an optimized exploration for high dimension large design space. The experiments show that GANDSE is able to find the more optimized designs in negligible time compared with approaches including multilayer perceptron and deep reinforcement learning.

--Deep Neural Network has proved its potential in various perception tasks and hence become an appealing option for interpretation and data processing in security sensitive systems. However, security-sensitive systems demand not only high perception performance, but also design robustness under various circumstances. Unlike prior works that study network robustness from software level, we investigate from hardware perspective about the impact of Single Event Upset (SEU) induced parameter perturbation (SIPP) on neural networks. We systematically define the fault models of SEU and then provide the definition of sensitivity to SIPP as the robustness measure for the network. We are then able to analytically explore the weakness of a network and summarize the key findings for the impact of SIPP on different types of bits in a floating point parameter, layer-wise robustness within the same network and impact of network depth. Based on those findings, we propose two remedy solutions to protect DNNs from SIPPs, which can mitigate accuracy degradation from 28% to 0.27% for ResNet with merely 0.24-bit SRAM area overhead per parameter . Index T erms --component, formatting, style, styling, insert I. DNNs) have recently attracted enormous attention due to the success in various perception tasks [1], [2] and it is an appealing idea to adopt DNNs in security sensitive systems for in-depth inference and efficient data processing, such as autonomous automobile and medical monitoring. On the other hand, the robustness of DNN itself is of great concern for such security related applications and hence has been widely studied.