DBSCAN has been widely used in density-based clustering algorithms. However, with the increasing demand for Multi-density clustering, previous traditional DSBCAN can not have good clustering results on Multi-density datasets. In order to address this problem, an adaptive Multi-density DBSCAN algorithm (AMD-DBSCAN) is proposed in this paper. An improved parameter adaptation method is proposed in AMD-DBSCAN to search for multiple parameter pairs (i.e., Eps and MinPts), which are the key parameters to determine the clustering results and performance, therefore allowing the model to be applied to Multi-density datasets. Moreover, only one hyperparameter is required for AMD-DBSCAN to avoid the complicated repetitive initialization operations. Furthermore, the variance of the number of neighbors (VNN) is proposed to measure the difference in density between each cluster. The experimental results show that our AMD-DBSCAN reduces execution time by an average of 75% due to lower algorithm complexity compared with the traditional adaptive algorithm. In addition, AMD-DBSCAN improves accuracy by 24.7% on average over the state-of-the-art design on Multi-density datasets of extremely variable density, while having no performance loss in Single-density scenarios. Our code and datasets are available at https://github.com/AlexandreWANG915/AMD-DBSCAN.

Noninvasive X-ray imaging of nanoscale three-dimensional objects, e.g. integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of complex electromagnetic field through ICs; and tomographic scanning, which collects complex field projections from multiple angles. Here, we present Attentional Ptycho-Tomography (APT), an approach trained to provide accurate reconstructions of ICs despite incomplete measurements, using a dramatically reduced amount of angular scanning. Training process includes regularizing priors based on typical IC patterns and the physics of X-ray propagation. We demonstrate that APT with 12-time reduced angles achieves fidelity comparable to the gold standard with the original set of angles. With the same set of reduced angles, APT also outperforms baseline reconstruction methods. In our experiments, APT achieves 108-time aggregate reduction in data acquisition and computation without compromising quality. We expect our physics-assisted machine learning framework could also be applied to other branches of nanoscale imaging.