We implement a specialized version of our SpeckleNN model for real-time speckle pattern classification in X-ray Single-Particle Imaging (SPI) using the SLAC Neural Network Library (SNL) on an FPGA. This hardware is optimized for inference near detectors in high-throughput X-ray free-electron laser (XFEL) facilities like the Linac Coherent Light Source (LCLS). To fit FPGA constraints, we optimized SpeckleNN, reducing parameters from 5.6M to 64.6K (98.8% reduction) with 90% accuracy. We also compressed the latent space from 128 to 50 dimensions. Deployed on a KCU1500 FPGA, the model used 71% of DSPs, 75% of LUTs, and 48% of FFs, with an average power consumption of 9.4W. The FPGA achieved 45.015us inference latency at 200 MHz. On an NVIDIA A100 GPU, the same inference consumed ~73W and had a 400us latency. Our FPGA version achieved an 8.9x speedup and 7.8x power reduction over the GPU. Key advancements include model specialization and dynamic weight loading through SNL, eliminating time-consuming FPGA re-synthesis for fast, continuous deployment of (re)trained models. These innovations enable real-time adaptive classification and efficient speckle pattern vetoing, making SpeckleNN ideal for XFEL facilities. This implementation accelerates SPI experiments and enhances adaptability to evolving conditions.

Serial crystallography at X-ray free electron laser (XFEL) and synchrotron facilities has experienced tremendous progress in recent times enabling novel scientific investigations into macromolecular structures and molecular processes. However, these experiments generate a significant amount of data posing computational challenges in data reduction and real-time feedback. Bragg peak finding algorithm is used to identify useful images and also provide real-time feedback about hit-rate and resolution. Shot-to-shot intensity fluctuations and strong background scattering from buffer solution, injection nozzle and other shielding materials make this a time-consuming optimization problem. Here, we present PeakNet, an autonomous Bragg peak finder that utilizes deep neural networks. The development of this system 1) eliminates the need for manual algorithm parameter tuning, 2) reduces false-positive peaks by adjusting to shot-to-shot variations in strong background scattering in real-time, 3) eliminates the laborious task of manually creating bad pixel masks and the need to store these masks per event since these can be regenerated on demand. PeakNet also exhibits exceptional runtime efficiency, processing a 1920-by-1920 pixel image around 90 ms on an NVIDIA 1080 Ti GPU, with the potential for further enhancements through parallelized analysis or GPU stream processing. PeakNet is well-suited for expert-level real-time serial crystallography data analysis at high data rates.

With X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structure of noncrystalline nanoscale particles using X-ray single-particle imaging (SPI) techniques at room temperature. Classifying SPI scattering patterns, or "speckles", to extract single hits that are needed for real-time vetoing and three-dimensional reconstruction poses a challenge for high data rate facilities like European XFEL and LCLS-II-HE. Here, we introduce SpeckleNN, a unified embedding model for real-time speckle pattern classification with limited labeled examples that can scale linearly with dataset size. Trained with twin neural networks, SpeckleNN maps speckle patterns to a unified embedding vector space, where similarity is measured by Euclidean distance. We highlight its few-shot classification capability on new never-seen samples and its robust performance despite only tens of labels per classification category even in the presence of substantial missing detector areas. Without the need for excessive manual labeling or even a full detector image, our classification method offers a great solution for real-time high-throughput SPI experiments.