Karunanayake, Naveen
Out-of-Distribution Data: An Acquaintance of Adversarial Examples -- A Survey
Karunanayake, Naveen, Gunawardena, Ravin, Seneviratne, Suranga, Chawla, Sanjay
Deep neural networks (DNNs) deployed in real-world applications can encounter out-of-distribution (OOD) data and adversarial examples. These represent distinct forms of distributional shifts that can significantly impact DNNs' reliability and robustness. Traditionally, research has addressed OOD detection and adversarial robustness as separate challenges. This survey focuses on the intersection of these two areas, examining how the research community has investigated them together. Consequently, we identify two key research directions: robust OOD detection and unified robustness. Robust OOD detection aims to differentiate between in-distribution (ID) data and OOD data, even when they are adversarially manipulated to deceive the OOD detector. Unified robustness seeks a single approach to make DNNs robust against both adversarial attacks and OOD inputs. Accordingly, first, we establish a taxonomy based on the concept of distributional shifts. This framework clarifies how robust OOD detection and unified robustness relate to other research areas addressing distributional shifts, such as OOD detection, open set recognition, and anomaly detection. Subsequently, we review existing work on robust OOD detection and unified robustness. Finally, we highlight the limitations of the existing work and propose promising research directions that explore adversarial and OOD inputs within a unified framework.
ExCeL : Combined Extreme and Collective Logit Information for Enhancing Out-of-Distribution Detection
Karunanayake, Naveen, Seneviratne, Suranga, Chawla, Sanjay
Deep learning models often exhibit overconfidence in predicting out-of-distribution (OOD) data, underscoring the crucial role of OOD detection in ensuring reliability in predictions. Among various OOD detection approaches, post-hoc detectors have gained significant popularity, primarily due to their ease of use and implementation. However, the effectiveness of most post-hoc OOD detectors has been constrained as they rely solely either on extreme information, such as the maximum logit, or on the collective information (i.e., information spanned across classes or training samples) embedded within the output layer. In this paper, we propose ExCeL that combines both extreme and collective information within the output layer for enhanced accuracy in OOD detection. We leverage the logit of the top predicted class as the extreme information (i.e., the maximum logit), while the collective information is derived in a novel approach that involves assessing the likelihood of other classes appearing in subsequent ranks across various training samples. Our idea is motivated by the observation that, for in-distribution (ID) data, the ranking of classes beyond the predicted class is more deterministic compared to that in OOD data. Experiments conducted on CIFAR100 and ImageNet-200 datasets demonstrate that ExCeL consistently is among the five top-performing methods out of twenty-one existing post-hoc baselines when the joint performance on near-OOD and far-OOD is considered (i.e., in terms of AUROC and FPR95). Furthermore, ExCeL shows the best overall performance across both datasets, unlike other baselines that work best on one dataset but has a performance drop in the other.