Vision anomaly detection, particularly in unsupervised settings, often struggles to distinguish between normal samples and anomalies due to the wide variability in anomalies. Recently, an increasing number of studies have focused on generating anomalies to help detectors learn more effective boundaries between normal samples and anomalies. However, as the generated anomalies are often derived from random factors, they frequently lack realism. Additionally, randomly generated anomalies typically offer limited support in constructing effective boundaries, as most differ substantially from normal samples and lie far from the boundary. To address these challenges, we propose Key Knowledge Augmentation (KKA), a method that extracts anomaly-related knowledge from large language models (LLMs). More specifically, KKA leverages the extensive prior knowledge of LLMs to generate meaningful anomalies based on normal samples. Then, KKA classifies the generated anomalies as easy anomalies and hard anomalies according to their similarity to normal samples. Easy anomalies exhibit significant differences from normal samples, whereas hard anomalies closely resemble normal samples. KKA iteratively updates the generated anomalies, and gradually increasing the proportion of hard anomalies to enable the detector to learn a more effective boundary. Experimental results show that the proposed method significantly improves the performance of various vision anomaly detectors while maintaining low generation costs. The code for CMG can be found at https://github.com/Anfeather/KKA.

Surface defect inspection plays an important role in the process of industrial manufacture and production. Though Convolutional Neural Network (CNN) based defect inspection methods have made huge leaps, they still confront a lot of challenges such as defect scale variation, complex background, low contrast, and so on. To address these issues, we propose a joint attention-guided feature fusion network (JAFFNet) for saliency detection of surface defects based on the encoder-decoder network. JAFFNet mainly incorporates a joint attention-guided feature fusion (JAFF) module into decoding stages to adaptively fuse low-level and high-level features. The JAFF module learns to emphasize defect features and suppress background noise during feature fusion, which is beneficial for detecting low-contrast defects. In addition, JAFFNet introduces a dense receptive field (DRF) module following the encoder to capture features with rich context information, which helps detect defects of different scales. The JAFF module mainly utilizes a learned joint channel-spatial attention map provided by high-level semantic features to guide feature fusion. The attention map makes the model pay more attention to defect features. The DRF module utilizes a sequence of multi-receptive-field (MRF) units with each taking as inputs all the preceding MRF feature maps and the original input. The obtained DRF features capture rich context information with a large range of receptive fields. Extensive experiments conducted on SD-saliency-900, Magnetic tile, and DAGM 2007 indicate that our method achieves promising performance in comparison with other state-of-the-art methods. Meanwhile, our method reaches a real-time defect detection speed of 66 FPS.

Out-of-distribution (OOD) detection methods often exploit auxiliary outliers to train model identifying OOD samples, especially discovering challenging outliers from auxiliary outliers dataset to improve OOD detection. However, they may still face limitations in effectively distinguishing between the most challenging OOD samples that are much like in-distribution (ID) data, i.e., ID-like samples. To this end, we propose a novel OOD detection framework that discovers ID-like outliers using CLIP from the vicinity space of the ID samples, thus helping to identify these most challenging OOD samples. Then a prompt learning framework is proposed that utilizes the identified ID-like outliers to further leverage the capabilities of CLIP for OOD detection. Benefiting from the powerful CLIP, we only need a small number of ID samples to learn the prompts of the model without exposing other auxiliary outlier datasets. By focusing on the most challenging ID-like OOD samples and elegantly exploiting the capabilities of CLIP, our method achieves superior few-shot learning performance on various real-world image datasets (e.g., in 4-shot OOD detection on the ImageNet-1k dataset, our method reduces the average FPR95 by 12.16% and improves the average AUROC by 2.76%, compared to state-of-the-art methods).