Artificial Intelligence Enhanced Atomic Force Microscopy

Despite its wide range of uses, there are some problems with traditional atomic force microscopy (AFM) techniques. A high level of skill set and human interference is required for this procedure and is very time-consuming. In this article, the use of artificial intelligence (AI) in AFM and its combined benefits has been described. Atomic Force Microscopy (AFM) is a potent technology that permits the imaging of practically any surface along with polymers, ceramics, composites, glass, and biological materials. It is a surface scanning technique that has sub-nanometer scale resolution.