Blog Review: Oct. 14

Arm's Hongsup Shin explains a machine learning application that can determine which tests are most likely to find hardware bugs, improving efficiency and reducing the number of tests that need to be run. Synopsys' Pieter van der Wolf and Dmitry Zakharov take a look at the increasing need for low power processors optimized for machine learning tasks as IoT, smart home, and wearable devices proliferate. Mentor's Alex Belelovsky considers why manufacturers make tweaks to board designs, the risks involved, and the importance of transparency. Cadence's Paul McLellan listens in on what's new with Arm's latest projects and a discussion between the CEOs of Nvidia and Arm about the impending acquisition. Ansys' Ushemadzoro Chipengo digs into how simulation can improve the design, validation, and testing of automotive radar systems, especially for determining performance in rare or dangerous corner cases.