The escalating complexity of System-on-Chip (SoC) designs has created a bottleneck in verification, with traditional techniques struggling to achieve complete coverage. Existing techniques, such as Constrained Random Verification (CRV) and coverage-driven methodologies, rely on time-consuming and redundant simulation regression, leading to higher verification costs and longer time-to-market due to the manual effort required to adjust constraints and drive the stimuli to achieve coverage objectives. To address this challenge, we propose a novel methodology that leverages supervised Machine Learning (ML) to optimize simulation regressions, resulting in reduced simulation run-time and the number of test simulations required to achieve target coverage goals. We also investigate and compare the effectiveness of various supervised learning algorithms from scikit-learn. Our results demonstrate that these algorithms can achieve at least 99% coverage regain with significantly reduced simulation cycles. We utilize Python Universal Verification Methodology (PyUVM) over SystemVerilog-Universal Verification Methodology (SV-UVM) for testbench creation, enabling simpler constructs using Python and facilitating the reuse of existing ML libraries. Our methodology is applied to three diverse designs, and our results show that it can significantly reduce verification costs, manual efforts, and time-to-market, while enhancing verification productivity and completeness, by automating the testbench update process and achieving target coverage goals.

The verification throughput is becoming a major challenge bottleneck, since the complexity and size of SoC designs are still ever increasing. Simply adding more CPU cores and running more tests in parallel will not scale anymore. This paper discusses various methods of improving verification throughput: ranking and the new machine learning (ML) based technology introduced by Cadence i.e. Xcelium ML. Both methods aim at getting comparable coverage in less CPU time by applying more efficient stimulus. Ranking selects specific seeds that simply turned out to come up with the largest coverage in previous simulations, while Xcelium ML generates optimized patterns as a result of finding correlations between randomization points and achieved coverage of previous regressions. Quantified results as well as pros & cons of each approach are discussed in this paper at the example of three actual industry projects. Both Xcelium ML and Ranking methods gave comparable compression & speedup factors around 3 consistently. But the optimized ML based regressions simulated new random scenarios occasionally producing a coverage regain of more than 100%. Finally, a methodology is proposed to use Xcelium ML efficiently throughout the product development.