self-diis error
Self-consistent Validation for Machine Learning Electronic Structure
Hu, Gengyuan, Wei, Gengchen, Lou, Zekun, Torr, Philip H. S., Ouyang, Wanli, Zhong, Han-sen, Lin, Chen
Shanghai Artificial Intelligence Laboratory and Department of Engineering, University of Oxford (Dated: February 16, 2024) Machine learning has emerged as a significant approach to efficiently tackle electronic structure problems. Despite its potential, there is less guarantee for the model to generalize to unseen data that hinders its application in real-world scenarios. To address this issue, a technique has been proposed to estimate the accuracy of the predictions. This method integrates machine learning with self-consistent field methods to achieve both low validation cost and interpret-ability. This, in turn, enables exploration of the model's ability with active learning and instills confidence in its integration into real-world studies.
- Asia > China > Shanghai > Shanghai (0.24)
- Europe > United Kingdom > England > Oxfordshire > Oxford (0.24)
- North America > United States > New York (0.04)
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