We investigate the relationship between three fundamental problems in machine learning: binary classification, bipartite ranking, and binary class probability estimation (CPE). It is known that a good binary CPE model can be used to obtain a good binary classification model (by thresholding at 0.5), and also to obtain a good bipartite ranking model (by using the CPE model directly as a ranking model); it is also known that a binary classification model does not necessarily yield a CPE model. However, not much is known about other directions. Formally, these relationships involve regret transfer bounds. In this paper, we introduce the notion of weak regret transfer bounds, where the mapping needed to transform a model from one problem to another depends on the underlying probability distribution (and in practice, must be estimated from data). We then show that, in this weaker sense, a good bipartite ranking model can be used to construct a good classification model (by thresholding at a suitable point), and more surprisingly, also to construct a good binary CPE model (by calibrating the scores of the ranking model).

Neural Information Processing Systems http://nips.cc/

Neural Information Processing Systems http://nips.cc/

Surrogate regret bounds, also called excess risk bounds, are a common tool to prove generalization rates for surrogate risk minimization.

We investigate the relationship between three fundamental problems in machine learning: binary classification, bipartite ranking, and binary class probability estimation (CPE). It is known that a good binary CPE model can be used to obtain a good binary classification model (by thresholding at 0.5), and also to obtain a good bipartite ranking model (by using the CPE model directly as a ranking model); it is also known that a binary classification model does not necessarily yield a CPE model. However, not much is known about other directions. Formally, these relationships involve regret transfer bounds. In this paper, we introduce the notion of weak regret transfer bounds, where the mapping needed to transform a model from one problem to another depends on the underlying probability distribution (and in practice, must be estimated from data). We then show that, in this weaker sense, a good bipartite ranking model can be used to construct a good classification model (by thresholding at a suitable point), and more surprisingly, also to construct a good binary CPE model (by calibrating the scores of the ranking model).

Surrogate risk minimization is an ubiquitous paradigm in supervised machine learning, wherein a target problem is solved by minimizing a surrogate loss on a dataset. Surrogate regret bounds, also called excess risk bounds, are a common tool to prove generalization rates for surrogate risk minimization. While surrogate regret bounds have been developed for certain classes of loss functions, such as proper losses, general results are relatively sparse. We provide two general results. The first gives a linear surrogate regret bound for any polyhedral (piecewise-linear and convex) surrogate, meaning that surrogate generalization rates translate directly to target rates. The second shows that for sufficiently non-polyhedral surrogates, the regret bound is a square root, meaning fast surrogate generalization rates translate to slow rates for the target. Together, these results suggest polyhedral surrogates are optimal in many cases.

The F-measure is a widely used performance measure for multi-label classification, where multiple labels can be active in an instance simultaneously (e.g. in image tagging, multiple tags can be active in any image). In particular, the F-measure explicitly balances recall (fraction of active labels predicted to be active) and precision (fraction of labels predicted to be active that are actually so), both of which are important in evaluating the overall performance of a multi-label classifier. As with most discrete prediction problems, however, directly optimizing the F-measure is computationally hard. In this paper, we explore the question of designing convex surrogate losses that are calibrated for the F-measure -- specifically, that have the property that minimizing the surrogate loss yields (in the limit of sufficient data) a Bayes optimal multi-label classifier for the F-measure. We show that the F-measure for an $s$-label problem, when viewed as a $2^s \times 2^s$ loss matrix, has rank at most $s^2+1$, and apply a result of Ramaswamy et al. (2014) to design a family of convex calibrated surrogates for the F-measure. The resulting surrogate risk minimization algorithms can be viewed as decomposing the multi-label F-measure learning problem into $s^2+1$ binary class probability estimation problems. We also provide a quantitative regret transfer bound for our surrogates, which allows any regret guarantees for the binary problems to be transferred to regret guarantees for the overall F-measure problem, and discuss a connection with the algorithm of Dembczynski et al. (2013). Our experiments confirm our theoretical findings.

We investigate the relationship between three fundamental problems in machine learning: binary classification, bipartite ranking, and binary class probability estimation (CPE). It is known that a good binary CPE model can be used to obtain a good binary classification model (by thresholding at 0.5), and also to obtain a good bipartite ranking model (by using the CPE model directly as a ranking model); it is also known that a binary classification model does not necessarily yield a CPE model. However, not much is known about other directions. Formally, these relationships involve regret transfer bounds. In this paper, we introduce the notion of weak regret transfer bounds, where the mapping needed to transform a model from one problem to another depends on the underlying probability distribution (and in practice, must be estimated from data). We then show that, in this weaker sense, a good bipartite ranking model can be used to construct a good classification model (by thresholding at a suitable point), and more surprisingly, also to construct a good binary CPE model (by calibrating the scores of the ranking model).

We investigate the relationship between three fundamental problems in machine learning: binary classification, bipartite ranking, and binary class probability estimation (CPE). It is known that a good binary CPE model can be used to obtain a good binary classification model (by thresholding at 0.5), and also to obtain a good bipartite ranking model (by using the CPE model directly as a ranking model); it is also known that a binary classification model does not necessarily yield a CPE model. However, not much is known about other directions. Formally, these relationships involve regret transfer bounds. In this paper, we introduce the notion of weak regret transfer bounds, where the mapping needed to transform a model from one problem to another depends on the underlying probability distribution (and in practice, must be estimated from data). We then show that, in this weaker sense, a good bipartite ranking model can be used to construct a good classification model (by thresholding at a suitable point), and more surprisingly, also to construct a good binary CPE model (by calibrating the scores of the ranking model).