This paper studies the task of one-shot fine-grained recognition, which suffers from the problem of data scarcity of novel fine-grained classes. To alleviate this problem, a off-the-shelf image generator can be applied to synthesize additional images to help one-shot learning. However, such synthesized images may not be helpful in one-shot fine-grained recognition, due to a large domain discrepancy between synthesized and original images. To this end, this paper proposes a meta-learning framework to reinforce the generated images by original images so that these images can facilitate one-shot learning. Specifically, the generic image generator is updated by few training instances of novel classes; and a Meta Image Reinforcing Network (MetaIRNet) is proposed to conduct one-shot fine-grained recognition as well as image reinforcement. The model is trained in an end-to-end manner, and our experiments demonstrate consistent improvement over baseline on one-shot fine-grained image classification benchmarks.

Learning from a few examples remains a key challenge in machine learning.

In this manner we obtain an efficient feed-forward one-shot learner, trained end-to-end by minimizing a one-shot classification objective in a learning to learn formulation. In order to make the construction feasible, we propose a number of factorizations of the parameters of the pupil network.

The proposed methodology is a variant of principal component regression (PCR).

First provide a summary of the paper, and then address the following criteria: Quality, clarity, originality and significance. This paper proposes a simple latent factor model for one-shot learning with continuous outputs where very few observations are available. Specifically, it derives risk approximations in an asymptotic regime where the number of training examples is fixed and the number of features in the X space diverges. Based on principal component regression (PCR) estimator, two estimators including the bias-corrected estimator and the so-called oracle estimator are proposed and the bounds for the risks of these estimators are derived. These bounds provide insights into the significance of various parameters relevant to one-shot learning.

Consider a $k$-SAT formula $\Phi$ where every variable appears at most $d$ times, and let $\sigma$ be a satisfying assignment of $\Phi$ sampled proportionally to $e^{\beta m(\sigma)}$ where $m(\sigma)$ is the number of variables set to true and $\beta$ is a real parameter. Given $\Phi$ and $\sigma$, can we learn the value of $\beta$ efficiently? This problem falls into a recent line of works about single-sample ("one-shot") learning of Markov random fields. The $k$-SAT setting we consider here was recently studied by Galanis, Kandiros, and Kalavasis (SODA'24) where they showed that single-sample learning is possible when roughly $d\leq 2^{k/6.45}$ and impossible when $d\geq (k+1) 2^{k-1}$. Crucially, for their impossibility results they used the existence of unsatisfiable instances which, aside from the gap in $d$, left open the question of whether the feasibility threshold for one-shot learning is dictated by the satisfiability threshold of $k$-SAT formulas of bounded degree. Our main contribution is to answer this question negatively. We show that one-shot learning for $k$-SAT is infeasible well below the satisfiability threshold; in fact, we obtain impossibility results for degrees $d$ as low as $k^2$ when $\beta$ is sufficiently large, and bootstrap this to small values of $\beta$ when $d$ scales exponentially with $k$, via a probabilistic construction. On the positive side, we simplify the analysis of the learning algorithm and obtain significantly stronger bounds on $d$ in terms of $\beta$. In particular, for the uniform case $\beta\rightarrow 0$ that has been studied extensively in the sampling literature, our analysis shows that learning is possible under the condition $d\lesssim 2^{k/2}$. This is nearly optimal (up to constant factors) in the sense that it is known that sampling a uniformly-distributed satisfying assignment is NP-hard for $d\gtrsim 2^{k/2}$.

This paper studies the task of one-shot fine-grained recognition, which suffers from the problem of data scarcity of novel fine-grained classes. To alleviate this problem, a off-the-shelf image generator can be applied to synthesize additional images to help one-shot learning. However, such synthesized images may not be helpful in one-shot fine-grained recognition, due to a large domain discrepancy between synthesized and original images. To this end, this paper proposes a meta-learning framework to reinforce the generated images by original images so that these images can facilitate one-shot learning. Specifically, the generic image generator is updated by few training instances of novel classes; and a Meta Image Reinforcing Network (MetaIRNet) is proposed to conduct one-shot fine-grained recognition as well as image reinforcement.

The quality of instruction data directly affects the performance of fine-tuned Large Language Models (LLMs). Previously, \cite{li2023one} proposed \texttt{NUGGETS}, which identifies and selects high-quality quality data from a large dataset by identifying those individual instruction examples that can significantly improve the performance of different tasks after being learnt as one-shot instances. In this work, we propose \texttt{SuperNUGGETS}, an improved variant of \texttt{NUGGETS} optimised for efficiency and performance. Our \texttt{SuperNUGGETS} uses a small language model (SLM) instead of a large language model (LLM) to filter the data for outstanding one-shot instances and refines the predefined set of tests. The experimental results show that the performance of \texttt{SuperNUGGETS} only decreases by 1-2% compared to \texttt{NUGGETS}, but the efficiency can be increased by a factor of 58. Compared to the original \texttt{NUGGETS}, our \texttt{SuperNUGGETS} has a higher utility value due to the significantly lower resource consumption.

The proposed methodology is a variant of principal component regression (PCR).

Learning from a few examples remains a key challenge in machine learning. Despite recent advances in important domains such as vision and language, the standard supervised deep learning paradigm does not offer a satisfactory solution for learning new concepts rapidly from little data. In this work, we employ ideas from metric learning based on deep neural features and from recent advances that augment neural networks with external memories. Our framework learns a network that maps a small labelled support set and an unlabelled example to its label, obviating the need for fine-tuning to adapt to new class types. We then define one-shot learning problems on vision (using Omniglot, ImageNet) and language tasks. Our algorithm improves one-shot accuracy on ImageNet from 87.6% to 93.2% and from 88.0% to 93.8% on Omniglot compared to competing approaches. We also demonstrate the usefulness of the same model on language modeling by introducing a one-shot task on the Penn Treebank.