Generativeadversarial networks (GANs) were originally envisioned asunsupervised generative models that learn to follow a target distribution.

Deep metric learning has gained much popularity in recent years, following the success of deep learning. However, existing frameworks of deep metric learning based on contrastive loss and triplet loss often suffer from slow convergence, partially because they employ only one negative example while not interacting with the other negative classes in each update. In this paper, we propose to address this problem with a new metric learning objective called multi-class N -pair loss . The proposed objective function firstly generalizes triplet loss by allowing joint comparison among more than one negative examples - more specifically, N -1 negative examples - and secondly reduces the computational burden of evaluating deep embedding vectors via an efficient batch construction strategy using only N pairs of examples, instead of ( N +1) N . We demonstrate the superiority of our proposed loss to the triplet loss as well as other competing loss functions for a variety of tasks on several visual recognition benchmark, including fine-grained object recognition and verification, image clustering and retrieval, and face verification and identification.

Although student learning satisfaction has been widely studied, modern techniques such as interpretable machine learning and neural networks have not been sufficiently explored. This study demonstrates that a recent model that combines boosting with interpretability, automatic piecewise linear regression(APLR), offers the best fit for predicting learning satisfaction among several state-of-the-art approaches. Through the analysis of APLR's numerical and visual interpretations, students' time management and concentration abilities, perceived helpfulness to classmates, and participation in offline courses have the most significant positive impact on learning satisfaction. Surprisingly, involvement in creative activities did not positively affect learning satisfaction. Moreover, the contributing factors can be interpreted on an individual level, allowing educators to customize instructions according to student profiles.