metric learning problem
Distributionally Robust Control with End-to-End Statistically Guaranteed Metric Learning
Wu, Jingyi, Ning, Chao, Shi, Yang
Wasserstein distributionally robust control (DRC) recently emerges as a principled paradigm for handling uncertainty in stochastic dynamical systems. However, it constructs data-driven ambiguity sets via uniform distribution shifts before sequentially incorporating them into downstream control synthesis. This segregation between ambiguity set construction and control objectives inherently introduces a structural misalignment, which undesirably leads to conservative control policies with sub-optimal performance. To address this limitation, we propose a novel end-to-end finite-horizon Wasserstein DRC framework that integrates the learning of anisotropic Wasserstein metrics with downstream control tasks in a closed-loop manner, thus enabling ambiguity sets to be systematically adjusted along performance-critical directions and yielding more effective control policies. This framework is formulated as a bilevel program: the inner level characterizes dynamical system evolution under DRC, while the outer level refines the anisotropic metric leveraging control-performance feedback across a range of initial conditions. To solve this program efficiently, we develop a stochastic augmented Lagrangian algorithm tailored to the bilevel structure. Theoretically, we prove that the learned ambiguity sets preserve statistical finite-sample guarantees under a novel radius adjustment mechanism, and we establish the well-posedness of the bilevel formulation by demonstrating its continuity with respect to the learnable metric. Furthermore, we show that the algorithm converges to stationary points of the outer level problem, which are statistically consistent with the optimal metric at a non-asymptotic convergence rate. Experiments on both numerical and inventory control tasks verify that the proposed framework achieves superior closed-loop performance and robustness compared against state-of-the-art methods.
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Discriminative Learning of Similarity and Group Equivariant Representations
One of the most fundamental problems in machine learning is to compare examples: Given a pair of objects we want to return a value which indicates degree of (dis)similarity. Similarity is often task specific, and pre-defined distances can perform poorly, leading to work in metric learning. However, being able to learn a similarity-sensitive distance function also presupposes access to a rich, discriminative representation for the objects at hand. In this dissertation we present contributions towards both ends. In the first part of the thesis, assuming good representations for the data, we present a formulation for metric learning that makes a more direct attempt to optimize for the k-NN accuracy as compared to prior work. We also present extensions of this formulation to metric learning for kNN regression, asymmetric similarity learning and discriminative learning of Hamming distance. In the second part, we consider a situation where we are on a limited computational budget i.e. optimizing over a space of possible metrics would be infeasible, but access to a label aware distance metric is still desirable. We present a simple, and computationally inexpensive approach for estimating a well motivated metric that relies only on gradient estimates, discussing theoretical and experimental results. In the final part, we address representational issues, considering group equivariant convolutional neural networks (GCNNs). Equivariance to symmetry transformations is explicitly encoded in GCNNs; a classical CNN being the simplest example. In particular, we present a SO(3)-equivariant neural network architecture for spherical data, that operates entirely in Fourier space, while also providing a formalism for the design of fully Fourier neural networks that are equivariant to the action of any continuous compact group.
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A metric learning perspective of SVM: on the relation of SVM and LMNN
Do, Huyen, Kalousis, Alexandros, Wang, Jun, Woznica, Adam
Support Vector Machines, SVMs, and the Large Margin Nearest Neighbor algorithm, LMNN, are two very popular learning algorithms with quite different learning biases. In this paper we bring them into a unified view and show that they have a much stronger relation than what is commonly thought. We analyze SVMs from a metric learning perspective and cast them as a metric learning problem, a view which helps us uncover the relations of the two algorithms. We show that LMNN can be seen as learning a set of local SVM-like models in a quadratic space. Along the way and inspired by the metric-based interpretation of SVM s we derive a novel variant of SVMs, epsilon-SVM, to which LMNN is even more similar. We give a unified view of LMNN and the different SVM variants. Finally we provide some preliminary experiments on a number of benchmark datasets in which show that epsilon-SVM compares favorably both with respect to LMNN and SVM.
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