Event logs are widely used for anomaly detection and prediction in complex systems. Existing log-based anomaly detection methods usually consist of four main steps: log collection, log parsing, feature extraction, and anomaly detection, wherein the feature extraction step extracts useful features for anomaly detection by counting log events. For a complex system, such as a lithography machine consisting of a large number of subsystems, its log may contain thousands of different events, resulting in abounding extracted features. However, when anomaly detection is performed at the subsystem level, analyzing all features becomes expensive and unnecessary. To mitigate this problem, we develop a feature selection method for log-based anomaly detection and prediction, largely improving the effectiveness and efficiency.

We present a framework that allows an observer to determine occluded portions of a structure by finding the maximum-likelihood estimate of those occluded portions consistent with visible image evidence and a consistency model. Doing this requires determining which portions of the structure are occluded in the first place. Since each process relies on the other, we determine a solution to both problems in tandem. We extend our framework to determine confidence of one's assessment of which portions of an observed structure are occluded, and the estimate of that occluded structure, by determining the sensitivity of one's assessment to potential new observations. We further extend our framework to determine a robotic action whose execution would allow a new observation that would maximally increase one's confidence.