This paper presents an AI-assisted auto-labeling system for display panel defect detection that leverages in-context learning capabilities. We adopt and enhance the SegGPT architecture with several domain-specific training techniques and introduce a scribble-based annotation mechanism to streamline the labeling process. Our two-stage training approach, validated on industrial display panel datasets, demonstrates significant improvements over the baseline model, achieving an average IoU increase of 0.22 and a 14% improvement in recall across multiple product types, while maintaining approximately 60% auto-labeling coverage. Experimental results show that models trained on our auto-labeled data match the performance of those trained on human-labeled data, offering a practical solution for reducing manual annotation efforts in industrial inspection systems.

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects. However, semiconductor manufacturing processes are continually evolving, leading to the emergence of new types of defects over time. This presents a significant challenge for conventional supervised defect detectors, as they may suffer from catastrophic forgetting when trained on new defect datasets, potentially compromising performance on previously learned tasks. An alternative approach involves the constant storage of previously trained datasets alongside pre-trained model versions, which can be utilized for (re-)training from scratch or fine-tuning whenever encountering a new defect dataset. However, adhering to such a storage template is impractical in terms of size, particularly when considering High-Volume Manufacturing (HVM). Additionally, semiconductor defect datasets, especially those encompassing stochastic defects, are often limited and expensive to obtain, thus lacking sufficient representation of the entire universal set of defectivity. This work introduces a task-agnostic, meta-learning approach aimed at addressing this challenge, which enables the incremental addition of new defect classes and scales to create a more robust and generalized model for semiconductor defect inspection. We have benchmarked our approach using real resist-wafer SEM (Scanning Electron Microscopy) datasets for two process steps, ADI and AEI, demonstrating its superior performance compared to conventional supervised training methods.

Recent advancements in cognitive computing, with the integration of deep learning techniques, have facilitated the development of intelligent cognitive systems (ICS). This is particularly beneficial in the context of rail defect detection, where the ICS would emulate human-like analysis of image data for defect patterns. Despite the success of Convolutional Neural Networks (CNN) in visual defect classification, the scarcity of large datasets for rail defect detection remains a challenge due to infrequent accident events that would result in defective parts and images. Contemporary researchers have addressed this data scarcity challenge by exploring rule-based and generative data augmentation models. Among these, Variational Autoencoder (VAE) models can generate realistic data without extensive baseline datasets for noise modeling. This study proposes a VAE-based synthetic image generation technique for rail defects, incorporating weight decay regularization and image reconstruction loss to prevent overfitting. The proposed method is applied to create a synthetic dataset for the Canadian Pacific Railway (CPR) with just 50 real samples across five classes. Remarkably, 500 synthetic samples are generated with a minimal reconstruction loss of 0.021. A Visual Transformer (ViT) model underwent fine-tuning using this synthetic CPR dataset, achieving high accuracy rates (98%-99%) in classifying the five defect classes. This research offers a promising solution to the data scarcity challenge in rail defect detection, showcasing the potential for robust ICS development in this domain.

Surface defect detection plays an increasingly important role in manufacturing industry to guarantee the product quality. Many deep learning methods have been widely used in surface defect detection tasks, and have been proven to perform well in defects classification and location. However, deep learning-based detection methods often require plenty of data for training, which fail to apply to the real industrial scenarios since the distribution of defect categories is often imbalanced. In other words, common defect classes have many samples but rare defect classes have extremely few samples, and it is difficult for these methods to well detect rare defect classes. To solve the imbalanced distribution problem, in this paper we propose TL-SDD: a novel Transfer Learning-based method for Surface Defect Detection. First, we adopt a two-phase training scheme to transfer the knowledge from common defect classes to rare defect classes. Second, we propose a novel Metric-based Surface Defect Detection (M-SDD) model. We design three modules for this model: (1) feature extraction module: containing feature fusion which combines high-level semantic information with low-level structural information. (2) feature reweighting module: transforming examples to a reweighting vector that indicates the importance of features. (3) distance metric module: learning a metric space in which defects are classified by computing distances to representations of each category. Finally, we validate the performance of our proposed method on a real dataset including surface defects of aluminum profiles. Compared to the baseline methods, the performance of our proposed method has improved by up to 11.98% for rare defect classes.

Recognition of defects in concrete infrastructure, especially in bridges, is a costly and time consuming crucial first step in the assessment of the structural integrity. Large variation in appearance of the concrete material, changing illumination and weather conditions, a variety of possible surface markings as well as the possibility for different types of defects to overlap, make it a challenging real-world task. In this work we introduce the novel COncrete DEfect BRidge IMage dataset (CODEBRIM) for multi-target classification of five commonly appearing concrete defects. We investigate and compare two reinforcement learning based meta-learning approaches, MetaQNN and efficient neural architecture search, to find suitable convolutional neural network architectures for this challenging multi-class multi-target task. We show that learned architectures have fewer overall parameters in addition to yielding better multi-target accuracy in comparison to popular neural architectures from the literature evaluated in the context of our application.