Neural Information Processing Systems http://nips.cc/

To what extent is the success of deep visualization due to the training? Could we do deep visualization using untrained, random weight networks? To address this issue, we explore new and powerful generative models for three popular deep visualization tasks using untrained, random weight convolutional neural networks. First we invert representations in feature spaces and reconstruct images from white noise inputs. The reconstruction quality is statistically higher than that of the same method applied on well trained networks with the same architecture.

To what extent is the success of deep visualization due to the training? Could we do deep visualization using untrained, random weight networks? To address this issue, we explore new and powerful generative models for three popular deep visualization tasks using untrained, random weight convolutional neural networks. First we invert representations in feature spaces and reconstruct images from white noise inputs. The reconstruction quality is statistically higher than that of the same method applied on well trained networks with the same architecture.

To what extent is the success of deep visualization due to the training? Could we do deep visualization using untrained, random weight networks? To address this issue, we explore new and powerful generative models for three popular deep visualization tasks using untrained, random weight convolutional neural networks. First we invert representations in feature spaces and reconstruct images from white noise inputs. The reconstruction quality is statistically higher than that of the same method applied on well trained networks with the same architecture.

The growing availability of the data collected from smart manufacturing is changing the paradigms of production monitoring and control. The increasing complexity and content of the wafer manufacturing process in addition to the time-varying unexpected disturbances and uncertainties, make it infeasible to do the control process with model-based approaches. As a result, data-driven soft-sensing modeling has become more prevalent in wafer process diagnostics. Recently, deep learning has been utilized in soft sensing system with promising performance on highly nonlinear and dynamic time-series data. Despite its successes in soft-sensing systems, however, the underlying logic of the deep learning framework is hard to understand. In this paper, we propose a deep learning-based model for defective wafer detection using a highly imbalanced dataset. To understand how the proposed model works, the deep visualization approach is applied. Additionally, the model is then fine-tuned guided by the deep visualization. Extensive experiments are performed to validate the effectiveness of the proposed system. The results provide an interpretation of how the model works and an instructive fine-tuning method based on the interpretation.

To what extent is the success of deep visualization due to the training? Could we do deep visualization using untrained, random weight networks? To address this issue, we explore new and powerful generative models for three popular deep visualization tasks using untrained, random weight convolutional neural networks. First we invert representations in feature spaces and reconstruct images from white noise inputs. The reconstruction quality is statistically higher than that of the same method applied on well trained networks with the same architecture.

To what extent is the success of deep visualization due to the training? Could we do deep visualization using untrained, random weight networks? To address this issue, we explore new and powerful generative models for three popular deep visualization tasks using untrained, random weight convolutional neural networks. First we invert representations in feature spaces and reconstruct images from white noise inputs. The reconstruction quality is statistically higher than that of the same method applied on well trained networks with the same architecture. Next we synthesize textures using scaled correlations of representations in multiple layers and our results are almost indistinguishable with the original natural texture and the synthesized textures based on the trained network. Third, by recasting the content of an image in the style of various artworks, we create artistic images with high perceptual quality, highly competitive to the prior work of Gatys et al. on pretrained networks. To our knowledge this is the first demonstration of image representations using untrained deep neural networks. Our work provides a new and fascinating tool to study the representation of deep network architecture and sheds light on new understandings on deep visualization. It may possibly lead to a way to compare network architectures without training.