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Vittorio Murino
Generalizing to Unseen Domains via Adversarial Data Augmentation
Riccardo Volpi, Hongseok Namkoong, Ozan Sener, John C. Duchi, Vittorio Murino, Silvio Savarese
We are concerned with learning models that generalize well to different unseen domains. We consider a worst-case formulation over data distributions that are near the source domain in the feature space. Only using training data from a single source distribution, we propose an iterative procedure that augments the dataset with examples from a fictitious target domain that is "hard" under the current model. We show that our iterative scheme is an adaptive data augmentation method where we append adversarial examples at each iteration. For softmax losses, we show that our method is a data-dependent regularization scheme that behaves differently from classical regularizers that regularize towards zero (e.g., ridge or lasso). On digit recognition and semantic segmentation tasks, our method learns models improve performance across a range of a priori unknown target domains.
Log-Hilbert-Schmidt metric between positive definite operators on Hilbert spaces
Minh Ha Quang, Marco San Biagio, Vittorio Murino
This paper introduces a novel mathematical and computational framework, namely Log-Hilbert-Schmidt metric between positive definite operators on a Hilbert space. This is a generalization of the Log-Euclidean metric on the Riemannian manifold of positive definite matrices to the infinite-dimensional setting. The general framework is applied in particular to compute distances between covariance operators on a Reproducing Kernel Hilbert Space (RKHS), for which we obtain explicit formulas via the corresponding Gram matrices. Empirically, we apply our formulation to the task of multi-category image classification, where each image is represented by an infinite-dimensional RKHS covariance operator. On several challenging datasets, our method significantly outperforms approaches based on covariance matrices computed directly on the original input features, including those using the Log-Euclidean metric, Stein and Jeffreys divergences, achieving new state of the art results.