L-TTA: Lightweight Test-Time Adaptation Using a Versatile Stem Layer

Test-time adaptation (TTA) is the most realistic methodology for adapting deep learning models to the real world using only unlabeled data from the target domain. Numerous TTA studies in deep learning have aimed at minimizing entropy. However, this necessitates forward/backward processes across the entire model and is limited by the incapability to fully leverage data based solely on entropy. This study presents a groundbreaking TTA solution that involves a departure from the conventional focus on minimizing entropy. Our innovative approach uniquely remodels the stem layer (i.e., the first layer) to emphasize minimizing a new learning criterion, namely, uncertainty.