Ultrametric Fitting by Gradient Descent

We study the problem of fitting an ultrametric distance to a dissimilarity graph in the context of hierarchical cluster analysis. Standard hierarchical clustering methods are specified procedurally, rather than in terms of the cost function to be optimized. We aim to overcome this limitation by presenting a general optimization framework for ultrametric fitting. Our approach consists of modeling the latter as a constrained optimization problem over the continuous space of ultrametrics. So doing, we can leverage the simple, yet effective, idea of replacing the ultrametric constraint with a min-max operation injected directly into the cost function.