Estimating Learnability in the Sublinear Data Regime

Kong, Weihao, Valiant, Gregory

Neural Information Processing Systems 

We consider the problem of estimating how well a model class is capable of fitting a distribution of labeled data. We show that it is often possible to accurately estimate this learnability'' even when given an amount of data that is too small to reliably learn any accurate model. Our first result applies to the setting where the data is drawn from a $d$-dimensional distribution with isotropic covariance, and the label of each datapoint is an arbitrary noisy function of the datapoint. In this setting, we show that with $O(\sqrt{d})$ samples, one can accurately estimate the fraction of the variance of the label that can be explained via the best linear function of the data. We extend these techniques to a binary classification, and show that the prediction error of the best linear classifier can be accurately estimated given $O(\sqrt{d})$ labeled samples.