Kernel Stein Tests for Multiple Model Comparison
Lim, Jen Ning, Yamada, Makoto, Schölkopf, Bernhard, Jitkrittum, Wittawat
–Neural Information Processing Systems
We address the problem of non-parametric multiple model comparison: given $l$ candidate models, decide whether each candidate is as good as the best one(s) or worse than it. We propose two statistical tests, each controlling a different notion of decision errors. The first test, building on the post selection inference framework, provably controls the number of best models that are wrongly declared worse (false positive rate). The second test is based on multiple correction, and controls the proportion of the models declared worse but are in fact as good as the best (false discovery rate). We prove that under appropriate conditions the first test can yield a higher true positive rate than the second.
Neural Information Processing Systems
Mar-18-2020, 21:16:58 GMT