Sensors provide computer systems with a window to the outside world. Activity recognition "sees" what is in the window to predict the locations, trajectories, actions, goals and plans of humans and objects. Building an activity recognition system requires a full range of interaction from statistical inference on lower level sensor data to symbolic AI at higher levels, where prediction results and acquired knowledge are passed up each level to form a knowledge food chain. In this article, I will give an overview of some of the current activity recognition research works and explore a life-cycle of learning and inference that allows the lowest-level radio-frequency signals to be transformed into symbolic logical representations for AI planning, which in turn controls the robots or guides human users through a sensor network, thus completing a full life-cycle of knowledge.

Interactive dynamic influence diagrams (I-DIDs) are graphical models for  sequential  decision making  in  partially observable  settings shared  by other  agents.  Algorithms  for solving  I-DIDs  face the challenge  of an  exponentially  growing space  of candidate  models ascribed to  other agents, over time. Previous  approach for exactly   solving I-DIDs groups together  models having similar solutions into behaviorally  equivalent  classes  and  updates these  classes.   We present a  new method that, in addition  to aggregating behaviorally equivalent  models, further groups  models that  prescribe identical actions at a single time step. We show how to update these augmented classes  and prove  that  our  method is  exact.   The new  approach   enables us to bound the aggregated model space by the cardinality of   other  agents'  actions. We  evaluate  its  performance and  provide   empirical results in support.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

Gaussian Processes (GPs) are promising Bayesian methods for classification and regression problems. They have also been used for semi-supervised learning tasks. In this paper, we propose a new algorithm for solving semi-supervised binary classification problem using sparse GP regression (GPR) models. It is closely related to semi-supervised learning based on support vector regression (SVR) and maximum margin clustering. The proposed algorithm is simple and easy to implement. It gives a sparse solution directly unlike the SVR based algorithm. Also, the hyperparameters are estimated easily without resorting to expensive cross-validation technique. Use of sparse GPR model helps in making the proposed algorithm scalable. Preliminary results on synthetic and real-world data sets demonstrate the efficacy of the new algorithm.

We consider the problem of estimating the conditional probability of a label in time $O(\log n)$, where $n$ is the number of possible labels. We analyze a natural reduction of this problem to a set of binary regression problems organized in a tree structure, proving a regret bound that scales with the depth of the tree. Motivated by this analysis, we propose the first online algorithm which provably constructs a logarithmic depth tree on the set of labels to solve this problem. We test the algorithm empirically, showing that it works succesfully on a dataset with roughly $10^6$ labels.

The problem is sequence prediction in the following setting. A sequence $x_1,...,x_n,...$ of discrete-valued observations is generated according to some unknown probabilistic law (measure) $\mu$. After observing each outcome, it is required to give the conditional probabilities of the next observation. The measure $\mu$ belongs to an arbitrary class $\C$ of stochastic processes. We are interested in predictors $\rho$ whose conditional probabilities converge to the "true" $\mu$-conditional probabilities if any $\mu\in\C$ is chosen to generate the data. We show that if such a predictor exists, then a predictor can also be obtained as a convex combination of a countably many elements of $\C$. In other words, it can be obtained as a Bayesian predictor whose prior is concentrated on a countable set. This result is established for two very different measures of performance of prediction, one of which is very strong, namely, total variation, and the other is very weak, namely, prediction in expected average Kullback-Leibler divergence.