I often talk about explainable AI(XAI) methods and how they can be adapted to address a few pain points that prohibit companies from building and deploying AI solutions. You can check my blog if you need a quick refresher on XAI methods. One such XAI method is Decision Trees. They have gained significant traction historically because of their interpretability and simplicity. However, many think that decision trees cannot be accurate because they look simple, and greedy algorithms like C4.5 and CART don't optimize them well.

In real industrial processes, fault diagnosis methods are required to learn from limited fault samples since the procedures are mainly under normal conditions and the faults rarely occur. Although attention mechanisms have become popular in the field of fault diagnosis, the existing attention-based methods are still unsatisfying for the above practical applications. First, pure attention-based architectures like transformers need a large number of fault samples to offset the lack of inductive biases thus performing poorly under limited fault samples. Moreover, the poor fault classification dilemma further leads to the failure of the existing attention-based methods to identify the root causes. To address the aforementioned issues, we innovatively propose a supervised contrastive convolutional attention mechanism (SCCAM) with ante-hoc interpretability, which solves the root cause analysis problem under limited fault samples for the first time. The proposed SCCAM method is tested on a continuous stirred tank heater and the Tennessee Eastman industrial process benchmark. Three common fault diagnosis scenarios are covered, including a balanced scenario for additional verification and two scenarios with limited fault samples (i.e., imbalanced scenario and long-tail scenario). The comprehensive results demonstrate that the proposed SCCAM method can achieve better performance compared with the state-of-the-art methods on fault classification and root cause analysis.

A multitude of work has shown that machine learning-based medical diagnosis systems can be biased against certain subgroups of people. This has motivated a growing number of bias mitigation algorithms that aim to address fairness issues in machine learning. However, it is difficult to compare their effectiveness in medical imaging for two reasons. First, there is little consensus on the criteria to assess fairness. Second, existing bias mitigation algorithms are developed under different settings, e.g., datasets, model selection strategies, backbones, and fairness metrics, making a direct comparison and evaluation based on existing results impossible. In this work, we introduce MEDFAIR, a framework to benchmark the fairness of machine learning models for medical imaging. MEDFAIR covers eleven algorithms from various categories, nine datasets from different imaging modalities, and three model selection criteria. Through extensive experiments, we find that the under-studied issue of model selection criterion can have a significant impact on fairness outcomes; while in contrast, state-of-the-art bias mitigation algorithms do not significantly improve fairness outcomes over empirical risk minimization (ERM) in both in-distribution and out-of-distribution settings. We evaluate fairness from various perspectives and make recommendations for different medical application scenarios that require different ethical principles. Our framework provides a reproducible and easy-to-use entry point for the development and evaluation of future bias mitigation algorithms in deep learning. Code is available at https://github.com/ys-zong/MEDFAIR.

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations.

Fault detection and diagnosis is significant for reducing maintenance costs and improving health and safety in chemical processes. Convolution neural network (CNN) is a popular deep learning algorithm with many successful applications in chemical fault detection and diagnosis tasks. However, convolution layers in CNN are very sensitive to the order of features, which can lead to instability in the processing of tabular data. Optimal order of features result in better performance of CNN models but it is expensive to seek such optimal order. In addition, because of the encapsulation mechanism of feature extraction, most CNN models are opaque and have poor interpretability, thus failing to identify root-cause features without human supervision. These difficulties inevitably limit the performance and credibility of CNN methods. In this paper, we propose an order-invariant and interpretable hierarchical dilated convolution neural network (HDLCNN), which is composed by feature clustering, dilated convolution and the shapley additive explanations (SHAP) method. The novelty of HDLCNN lies in its capability of processing tabular data with features of arbitrary order without seeking the optimal order, due to the ability to agglomerate correlated features of feature clustering and the large receptive field of dilated convolution. Then, the proposed method provides interpretability by including the SHAP values to quantify feature contribution. Therefore, the root-cause features can be identified as the features with the highest contribution. Computational experiments are conducted on the Tennessee Eastman chemical process benchmark dataset. Compared with the other methods, the proposed HDLCNN-SHAP method achieves better performance on processing tabular data with features of arbitrary order, detecting faults, and identifying the root-cause features.

Intelligent fault diagnosis has made extraordinary advancements currently. Nonetheless, few works tackle class-incremental learning for fault diagnosis under limited fault data, i.e., imbalanced and long-tailed fault diagnosis, which brings about various notable challenges. Initially, it is difficult to extract discriminative features from limited fault data. Moreover, a well-trained model must be retrained from scratch to classify the samples from new classes, thus causing a high computational burden and time consumption. Furthermore, the model may suffer from catastrophic forgetting when trained incrementally. Finally, the model decision is biased toward the new classes due to the class imbalance. The problems can consequently lead to performance degradation of fault diagnosis models. Accordingly, we introduce a supervised contrastive knowledge distillation for incremental fault diagnosis under limited fault data (SCLIFD) framework to address these issues, which extends the classical incremental classifier and representation learning (iCaRL) framework from three perspectives. Primarily, we adopt supervised contrastive knowledge distillation (KD) to enhance its representation learning capability under limited fault data. Moreover, we propose a novel prioritized exemplar selection method adaptive herding (AdaHerding) to restrict the increase of the computational burden, which is also combined with KD to alleviate catastrophic forgetting. Additionally, we adopt the cosine classifier to mitigate the adverse impact of class imbalance. We conduct extensive experiments on simulated and real-world industrial processes under different imbalance ratios. Experimental results show that our SCLIFD outperforms the existing methods by a large margin.

Early detection of many life-threatening diseases (e.g., prostate and breast cancer) within at-risk population can improve clinical outcomes and reduce cost of care. While numerous disease-specific "screening" tests that are closer to Point-of-Care (POC) are in use for this task, their low specificity results in unnecessary biopsies, leading to avoidable patient trauma and wasteful healthcare spending. On the other hand, despite the high accuracy of Magnetic Resonance (MR) imaging in disease diagnosis, it is not used as a POC disease identification tool because of poor accessibility. The root cause of poor accessibility of MR stems from the requirement to reconstruct high-fidelity images, as it necessitates a lengthy and complex process of acquiring large quantities of high-quality k-space measurements. In this study we explore the feasibility of an ML-augmented MR pipeline that directly infers the disease sidestepping the image reconstruction process. We hypothesise that the disease classification task can be solved using a very small tailored subset of k-space data, compared to image reconstruction. Towards that end, we propose a method that performs two tasks: 1) identifies a subset of the k-space that maximizes disease identification accuracy, and 2) infers the disease directly using the identified k-space subset, bypassing the image reconstruction step. We validate our hypothesis by measuring the performance of the proposed system across multiple diseases and anatomies. We show that comparable performance to image-based classifiers, trained on images reconstructed with full k-space data, can be achieved using small quantities of data: 8% of the data for detecting multiple abnormalities in prostate and brain scans, and 5% of the data for knee abnormalities. To better understand the proposed approach and instigate future research, we provide an extensive analysis and release code.

The Computer-aided Diagnosis or Detection (CAD) approach for skin lesion analysis is an emerging field of research that has the potential to alleviate the burden and cost of skin cancer screening. Researchers have recently indicated increasing interest in developing such CAD systems, with the intention of providing a user-friendly tool to dermatologists to reduce the challenges encountered or associated with manual inspection. This article aims to provide a comprehensive literature survey and review of a total of 594 publications (356 for skin lesion segmentation and 238 for skin lesion classification) published between 2011 and 2022. These articles are analyzed and summarized in a number of different ways to contribute vital information regarding the methods for the development of CAD systems. These ways include relevant and essential definitions and theories, input data (dataset utilization, preprocessing, augmentations, and fixing imbalance problems), method configuration (techniques, architectures, module frameworks, and losses), training tactics (hyperparameter settings), and evaluation criteria. We intend to investigate a variety of performance-enhancing approaches, including ensemble and post-processing. We also discuss these dimensions to reveal their current trends based on utilization frequencies. In addition, we highlight the primary difficulties associated with evaluating skin lesion segmentation and classification systems using minimal datasets, as well as the potential solutions to these difficulties. Findings, recommendations, and trends are disclosed to inform future research on developing an automated and robust CAD system for skin lesion analysis.

Root Cause Analysis (RCA) plays an indispensable role in distributed data system maintenance and operations, as it bridges the gap between fault detection and system recovery. Existing works mainly study multidimensional localization or graph-based root cause localization. This paper opens up the possibilities of exploiting the recently developed framework of explainable AI (XAI) for the purpose of RCA. In particular, we propose BALANCE (BAyesian Linear AttributioN for root CausE localization), which formulates the problem of RCA through the lens of attribution in XAI and seeks to explain the anomalies in the target KPIs by the behavior of the candidate root causes. BALANCE consists of three innovative components. First, we propose a Bayesian multicollinear feature selection (BMFS) model to predict the target KPIs given the candidate root causes in a forward manner while promoting sparsity and concurrently paying attention to the correlation between the candidate root causes. Second, we introduce attribution analysis to compute the attribution score for each candidate in a backward manner. Third, we merge the estimated root causes related to each KPI if there are multiple KPIs. We extensively evaluate the proposed BALANCE method on one synthesis dataset as well as three real-world RCA tasks, that is, bad SQL localization, container fault localization, and fault type diagnosis for Exathlon. Results show that BALANCE outperforms the state-of-the-art (SOTA) methods in terms of accuracy with the least amount of running time, and achieves at least $6\%$ notably higher accuracy than SOTA methods for real tasks. BALANCE has been deployed to production to tackle real-world RCA problems, and the online results further advocate its usage for real-time diagnosis in distributed data systems.

Interpretability of reinforcement learning policies is essential for many real-world tasks but learning such interpretable policies is a hard problem. Particularly rule-based policies such as decision trees and rules lists are difficult to optimize due to their non-differentiability. While existing techniques can learn verifiable decision tree policies there is no guarantee that the learners generate a decision that performs optimally. In this work, we study the optimization of size-limited decision trees for Markov Decision Processes (MPDs) and propose OMDTs: Optimal MDP Decision Trees. Given a user-defined size limit and MDP formulation OMDT directly maximizes the expected discounted return for the decision tree using Mixed-Integer Linear Programming. By training optimal decision tree policies for different MDPs we empirically study the optimality gap for existing imitation learning techniques and find that they perform sub-optimally. We show that this is due to an inherent shortcoming of imitation learning, namely that complex policies cannot be represented using size-limited trees. In such cases, it is better to directly optimize the tree for expected return. While there is generally a trade-off between the performance and interpretability of machine learning models, we find that OMDTs limited to a depth of 3 often perform close to the optimal limit.