Many computer aided diagnosis (CAD) problems can be best modelled as a multiple-instance learning (MIL) problem with unbalanced data: i.e., the training data typically consists of a few positive bags, and a very large number of negative instances.Existing MIL algorithms are much too computationally expensive for these datasets. We describe CH, a framework for learning a Convex Hull representation of multiple instances that is significantly faster than existing MIL algorithms. Our CH framework applies to any standard hyperplane-based learning algorithm, and for some algorithms, is guaranteed to find the global optimal solution. Experimentalstudies on two different CAD applications further demonstrate that the proposed algorithm significantly improves diagnostic accuracy when compared toboth MIL and traditional classifiers. Although not designed for standard MIL problems (which have both positive and negative bags and relatively balanced datasets),comparisons against other MIL methods on benchmark problems also indicate that the proposed method is competitive with the state-of-the-art.

The infrastructure of modern society is controlled by software systems that are vulnerable to attacks. Many such attacks, launched by "recreational hackers" have already led to severe disruptions and significant cost. It, therefore, is critical that we find ways to protect such systems and to enable them to continue functioning even after a successful attack. This article describes AWDRAT, a prototype middleware system for providing survivability to both new and legacy applications. AWDRAT stands for architectural differencing, wrappers, diagnosis, recovery, adaptive software, and trust modeling. AWDRAT uses these techniques to gain visibility into the execution of an application system and to compare the application's actual behavior to that which is expected. In the case of a deviation, AWDRAT conducts a diagnosis that determines which computational resources are likely to have been compromised and then adds these assessments to its trust model. The trust model in turn guides the recovery process, particularly by guiding the system in its choice among functionally equivalent methods and resources.AWDRAT has been applied to and evaluated on an example application system, a graphical editor for constructing mission plans. We describe a series of experiments that were performed to test the effectiveness of AWDRAT in recognizing and recovering from simulated attacks, and we present data showing the effectiveness of AWDRAT in detecting a variety of compromises to the application system (approximately 90 percent of all simulated attacks are detected, diagnosed, and corrected). We also summarize some lessons learned from the AWDRAT experiments and suggest approaches for comprehensive application protection methods and techniques.

The SEMATECH sponsored J-88-E project teaming Texas Instruments with NeuroDyne (et al.) focused on Fault Detection and Classification (FDC) on a Lam 9600 aluminum plasma etch reactor, used in the process of semiconductor fabrication. Fault classification was accomplished by implementing a series of virtual sensor models which used data from real sensors (Lam Station sensors, Optical Emission Spectroscopy, and RF Monitoring) to predict recipe setpoints and wafer state characteristics. Fault detection and classification were performed by comparing predicted recipe and wafer state values with expected values. Models utilized include linear PLS, Polynomial PLS, and Neural Network PLS. Prediction of recipe setpoints based upon sensor data provides a capability for cross-checking that the machine is maintaining the desired setpoints. Wafer state characteristics such as Line Width Reduction and Remaining Oxide were estimated on-line using these same process sensors (Lam, OES, RFM). Wafer-to-wafer measurement of these characteristics in a production setting (where typically this information may be only sparsely available, if at all, after batch processing runs with numerous wafers have been completed) would provide important information to the operator that the process is or is not producing wafers within acceptable bounds of product quality. Production yield is increased, and correspondingly per unit cost is reduced, by providing the operator with the opportunity to adjust the process or machine before etching more wafers.

Recently, the diagnosability of {\it stochastic discrete event systems} (SDESs) was investigated in the literature, and, the failure diagnosis considered was {\it centralized}. In this paper, we propose an approach to {\it decentralized} failure diagnosis of SDESs, where the stochastic system uses multiple local diagnosers to detect failures and each local diagnoser possesses its own information. In a way, the centralized failure diagnosis of SDESs can be viewed as a special case of the decentralized failure diagnosis presented in this paper with only one projection. The main contributions are as follows: (1) We formalize the notion of codiagnosability for stochastic automata, which means that a failure can be detected by at least one local stochastic diagnoser within a finite delay. (2) We construct a codiagnoser from a given stochastic automaton with multiple projections, and the codiagnoser associated with the local diagnosers is used to test codiagnosability condition of SDESs. (3) We deal with a number of basic properties of the codiagnoser. In particular, a necessary and sufficient condition for the codiagnosability of SDESs is presented. (4) We give a computing method in detail to check whether codiagnosability is violated. And (5) some examples are described to illustrate the applications of the codiagnosability and its computing method.

Decision trees are surprisingly adaptive in three important respects: They automatically (1) adapt to favorable conditions near the Bayes decision boundary; (2) focus on data distributed on lower dimensional manifolds; (3) reject irrelevant features. In this paper we examine a decision tree based on dyadic splits that adapts to each of these conditions to achieve minimax optimal rates of convergence. The proposed classifier is the first known to achieve these optimal rates while being practical and implementable.

Decision trees are surprisingly adaptive in three important respects: They automatically (1) adapt to favorable conditions near the Bayes decision boundary; (2) focus on data distributed on lower dimensional manifolds; (3) reject irrelevant features. In this paper we examine a decision tree based on dyadic splits that adapts to each of these conditions to achieve minimax optimal rates of convergence. The proposed classifier is the first known to achieve these optimal rates while being practical and implementable.

Decision trees are surprisingly adaptive in three important respects: They automatically (1) adapt to favorable conditions near the Bayes decision boundary; (2) focus on data distributed on lower dimensional manifolds; (3) reject irrelevant features. In this paper we examine a decision tree based on dyadic splits that adapts to each of these conditions to achieve minimax optimal rates of convergence. The proposed classifier is the first known to achieve these optimal rates while being practical and implementable.

The automotive industry was the first to promote the development of applications of model-based systems technology on a broad scale and, as a result, has produced some of the most advanced prototypes and products. In this article, we illustrate the features and benefits of model-based systems and qualitative modeling by prototypes and application systems that were developed in the automotive industry to support on-board diagnosis, design for diagnosability, and failure modes and effects analysis.

The automatic generation of decision trees based on off-line reasoning on models of a domain is a reasonable compromise between the advantages of using a model-based approach in technical domains and the constraints imposed by embedded applications. In this paper we extend the approach to deal with temporal information. We introduce a notion of temporal decision tree, which is designed to make use of relevant information as long as it is acquired, and we present an algorithm for compiling such trees from a model-based reasoning system.

I report on my experience over the past few years in introducing automated, model-based diagnostic technologies into industrial settings. In partic-ular, I discuss the competition that this technology has been receiving from handcrafted, rule-based diagnostic systems that has set some high standards that must be met by model-based systems before they can be viewed as viable alternatives. My goal in this article is to provide a perspective on this competition and discuss a diagnostic tool, called DTOOL/CNETS, that I have been developing over the years as I tried to address the major challenges posed by rule-based systems. In particular, I discuss three major features of the developed tool that were either adopted, designed, or innovated to address these challenges: (1) its compositional modeling approach, (2) its structure-based computational approach, and (3) its ability to synthesize embeddable diagnostic systems for a variety of software and hardware platforms.