Graph construction is the essential first step for nearly all manifold learning algorithms. While many applications assume that a simple k-nearest or epsilon-close neighbors graph will accurately model the topology of the underlying manifold, these methods often require expert tuning and may not produce high quality graphs. In this paper, the hyperparameter sensitivity of existing graph construction methods is demonstrated. We then present a new algorithm for unsupervised graph construction, based on minimal assumptions about the input data and its manifold structure.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.