Goto

Collaborating Authors

Unbiased Evaluation of Deep Metric Learning Algorithms

arXiv.org Machine Learning

Deep metric learning (DML) is a popular approach for images retrieval, solving verification (same or not) problems and addressing open set classification. Arguably, the most common DML approach is with triplet loss, despite significant advances in the area of DML. Triplet loss suffers from several issues such as collapse of the embeddings, high sensitivity to sampling schemes and more importantly a lack of performance when compared to more modern methods. W e attribute this adoption to a lack of fair comparisons between various methods and the difficulty in adopting them for novel problem statements. In this paper, we perform an unbiased comparison of the most popular DML baseline methods under same conditions and more importantly, not obfuscating any hyper parameter tuning or adjustment needed to favor a particular method. W e find, that under equal conditions several older methods perform significantly better than previously believed. In fact, our unified implementation of 12 recently introduced DML algorithms achieve state-of-the art performance on CUB200, CAR196, and Stanford Online products datasets which establishes a new set of baselines for future DML research. The codebase and all tuned hyperparame-ters will be open-sourced for reproducibility and to serve as a source of benchmark.


The Group Loss for Deep Metric Learning

arXiv.org Machine Learning

Deep metric learning has yielded impressive results in tasks such as clustering and image retrieval by leveraging neural networks to obtain highly discriminative feature embeddings, which can be used to group samples into different classes. Much research has been devoted to the design of smart loss functions or data mining strategies for training such networks. Most methods consider only pairs or triplets of samples within a mini-batch to compute the loss function, which is commonly based on the distance between embeddings. We propose Group Loss, a loss function based on a differentiable label-propagation method that enforces embedding similarity across all samples of a group while promoting, at the same time, low-density regions amongst data points belonging to different groups. Guided by the smoothness assumption that "similar objects should belong to the same group", the proposed loss trains the neural network for a classification task, enforcing a consistent labelling amongst samples within a class. We show state-of-the-art results on clustering and image retrieval on several datasets, and show the potential of our method when combined with other techniques such as ensembles


Local Similarity-Aware Deep Feature Embedding

Neural Information Processing Systems

Existing deep embedding methods in vision tasks are capable of learning a compact Euclidean space from images, where Euclidean distances correspond to a similarity metric. To make learning more effective and efficient, hard sample mining is usually employed, with samples identified through computing the Euclidean feature distance. However, the global Euclidean distance cannot faithfully characterize the true feature similarity in a complex visual feature space, where the intraclass distance in a high-density region may be larger than the interclass distance in low-density regions. In this paper, we introduce a Position-Dependent Deep Metric (PDDM) unit, which is capable of learning a similarity metric adaptive to local feature structure. The metric can be used to select genuinely hard samples in a local neighborhood to guide the deep embedding learning in an online and robust manner. The new layer is appealing in that it is pluggable to any convolutional networks and is trained end-to-end. Our local similarity-aware feature embedding not only demonstrates faster convergence and boosted performance on two complex image retrieval datasets, its large margin nature also leads to superior generalization results under the large and open set scenarios of transfer learning and zero-shot learning on ImageNet 2010 and ImageNet-10K datasets.


Learning Deep Embeddings with Histogram Loss

Neural Information Processing Systems

We suggest a new loss for learning deep embeddings. The key characteristics of the new loss is the absence of tunable parameters and very good results obtained across a range of datasets and problems. The loss is computed by estimating two distribution of similarities for positive (matching) and negative (non-matching) point pairs, and then computing the probability of a positive pair to have a lower similarity score than a negative pair based on these probability estimates. We show that these operations can be performed in a simple and piecewise-differentiable manner using 1D histograms with soft assignment operations. This makes the proposed loss suitable for learning deep embeddings using stochastic optimization. The experiments reveal favourable results compared to recently proposed loss functions.


Improved Deep Metric Learning with Multi-class N-pair Loss Objective

Neural Information Processing Systems

Deep metric learning has gained much popularity in recent years, following the success of deep learning. However, existing frameworks of deep metric learning based on contrastive loss and triplet loss often suffer from slow convergence, partially because they employ only one negative example while not interacting with the other negative classes in each update. In this paper, we propose to address this problem with a new metric learning objective called multiclassN -pair loss . The proposed objective function firstly generalizes triplet loss by allowing joint comparison among more than one negative examples - more specifically,N -1 negative examples - and secondly reduces the computational burden of evaluating deep embedding vectors via an efficient batch construction strategy using onlyN pairs of examples, instead of (N 1) N . We demonstrate the superiority of our proposed loss to the triplet loss as well as other competing loss functions for a variety of tasks on several visual recognition benchmark, including fine-grained object recognition and verification, image clustering and retrieval, and face verification and identification.